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Double Sided Wafer Prober


Applications

PCP-series is a prober developed to make tests of a thin layered wafer, a diced wafer, and a peculiar shaped board in addition to a conventional wafer a reality.It is designed to convey a conventional wafer, a film frame with a wafer or a peculiar shaped board automatically from the cassette, pre-align, fine-align, and probe.


Features

  • PCP-102WS :Double Sided Wafer Prober

Specification

  • PCP-102WS : Wafer Size:150mm(6'') 200mm(8'') 125mm(5'' ※option)
  • Foot prints:W1100mm*D860mm/Weight:400kg

Keyword

Double Sided Wafer Prober,兩面點測機,兩面探針測量機,两面点测机,两面探针测量机