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Film Frame Prober


Applications

PCP-series is a prober developed to make tests of a thin layered wafer, a diced wafer, and a peculiar shaped board in addition to a conventional wafer a reality.It is designed to convey a conventional wafer, a film frame with a wafer or a peculiar shaped board automatically from the cassette, pre-align, fine-align, and probe.


Features

  • PCP-102T:Thin Wafer Prober

Specification

  • PCP-102T:Wafer Size:100mm(4'')~200mm(8'')
  • Foot prints:W1100mm*D860mm/Weight:400kg

Keyword

Film Frame Prober,薄化晶圓點測機,薄化晶圓探針測量機,薄化晶圆点测机,薄化晶圆探针测量机